Test systems


Electrical test


While conducting the functional check of different modules, all faults cannot always be detected with visual test.
Supplementary to this, Gigler has different test systems for optimising the process of inspection:
 

  • ICT (= In-Circuit-Test): In this test, the measured value of the electrical strands in components is tested.
  • Colour intensity / Light colour: The measurement takes place with the help of light sensors.
  • FAT (= functional and calibration test): The circuit boards are tested with respect to their function.

Principally, the following applies:

The earlier the fault is detected, lesser are the costs incurred. Since the adapter is integrated inside, we can cater to your requirements and support you while designing the layout on DFT (Design for Testability).

If we have aroused your interest and if you want us to send you a non-binding offer, please register yourself here:

K.Attenberger@gigler-elektronik.de or simply use our Contact form.

 

 


 

Alternating Climate Test Guarantees Product Quality 

Gigler always gives its best to offer quality on a high level.

We ensure reliability; weak spots are detected at an early stage. Therefore, Gigler has invested in alternating climate tests.

Burn-In-Test

A burn-in test simulates the aging of a component which makes it possible to identify weak spots of components or material. The burn-in test usually has higher temperatures than a run-in test; experience has shown that defective components, which haven’t had any noticeable weak spots in previous short tests, burn out.Gigler Elektronik - Burn-In-Test

Components that survive the burn-in test are supposed to have a long service life.

A temperature test lasting more than 24 hours is recommended especially for highly failure-resistant products. The cabin contains 340 liters. It can easily test entire 19 Inch racks up to 12 HE.

 

Characteristics:
  • type: ESPEC PL2 J
  • temperature: – 40 - + 180 °C
  • Humidity: 10 – 98% RH
  • Cabin size: 500 x 750 x 600 mm³ (Height x Width x Depth)
  • Microprocessor control
  • Heating rate: 3k/min
  • Cooling rate: 2k/min

 


 

Run-In-Test

A run-in test is testing for the components’ reliability. Therefore, the components undergo a cyclical change of temperature while being plugged to supply voltage. The temperature range that needs to be tested is usually the same as later in practice.